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  1. Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
    Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
    José Pineda de Gyvez
    Springer US, Springer US
    Taschenbuch
    BOD - 2 Tage

    Defect-oriented testing methods have come a long way from a mere interesting academic exercise to...

    216,15 €
    Alle Preise inkl. MwSt | Versandkostenfrei
  2. Integrated Circuit Defect-Sensitivity: Theory and Computational Models
    Integrated Circuit Defect-Sensitivity: Theory and Computational Models
    José Pineda de Gyvez
    Springer, Springer
    Taschenbuch
    BOD - 2 Tage

    The history of this book begins way back in 1982. At that time a research proposal was filed with...

    110,35 €
    Alle Preise inkl. MwSt | Versandkostenfrei
  3. Low-Power High-Resolution Analog to Digital Converters
    Low-Power High-Resolution Analog to Digital Converters
    José Pineda de Gyvez
    Springer Netherlands, Springer Netherlands
    Taschenbuch
    BOD - 2 Tage

    With the fast advancement of CMOS fabrication technology, more and more signal-processing functio...

    56,79 €
    Alle Preise inkl. MwSt | Versandkostenfrei
  4. Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
    Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
    José Pineda de Gyvez
    Springer US, Springer
    Buch
    BOD - 7 Tage

    Defect-oriented testing methods have come a long way from a mere interesting academic exercise to...

    216,15 €
    Alle Preise inkl. MwSt | Versandkostenfrei
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