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  1. Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
    Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
    Manoj Sachdev
    Springer
    Taschenbuch
    BOD - 2 Tage

    Defect-oriented testing methods have come a long way from a mere interesting academic exercise to...

    216,15 €
    Alle Preise inkl. MwSt | Versandkostenfrei
  2. ESD Protection Device and Circuit Design for Advanced CMOS Technologies
    ESD Protection Device and Circuit Design for Advanced CMOS Technologies
    Hossein Sarbishaei
    Springer
    Taschenbuch
    BOD - 2 Tage

    ESD Protection Device and Circuit Design for Advanced CMOS Technologies is intended for practicin...

    185,32 €
    Alle Preise inkl. MwSt | Versandkostenfrei
  3. Thermal and Power Management of Integrated Circuits
    Thermal and Power Management of Integrated Circuits
    Arman Vassighi
    Springer
    Taschenbuch
    BOD - 2 Tage

    In Thermal and Power Management of Integrated Circuits, power and thermal management issues in in...

    110,35 €
    Alle Preise inkl. MwSt | Versandkostenfrei
  4. CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies
    CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies
    Andrei Pavlov
    Springer
    Taschenbuch
    BOD - 2 Tage

    CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies covers a broad range of ...

    174,61 €
    Alle Preise inkl. MwSt | Versandkostenfrei
  5. Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
    Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
    Manoj Sachdev
    Springer
    Buch
    BOD - 7 Tage

    Defect-oriented testing methods have come a long way from a mere interesting academic exercise to...

    216,15 €
    Alle Preise inkl. MwSt | Versandkostenfrei
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