Electrothermal Analysis of VLSI Systems addresseselectrothermal problems in modern VLSI systems...

Moore's law [Noy77], which predicted that the number of devices in­ tegrated on a chip would be d...

Electrical overstress (EOS) and Electrostatic discharge (ESD)pose one of the most dominant thre...

As the complexity and the density of VLSI chips increase with shrinking design rules, the evaluat...

Physical Design for Multichip Modules collects togethera large body of important research work ...

As the complexity and the density of VLSI chips increase with shrinking design rules, the evaluat...

Moore's law [Noy77], which predicted that the number of devices in­ tegrated on a chip would be d...

Physical Design for Multichip Modules collects togethera large body of important research work ...

Electrical overstress (EOS) and Electrostatic discharge (ESD)pose one of the most dominant thre...

Electrothermal Analysis of VLSI Systems addresseselectrothermal problems in modern VLSI systems...