In the past four years we have witnessed rapid development in technology and significant market p...

Chapter 1. From Si towards SiC technology for Harsh Environment Sensing.- Chapter 2. Electro-Ther...

This book aims to provide a comprehensive reference into the critical subject of failure and degr...

This book describes the latest progress in reliability analysis of microelectronic products. The ...

In the past four years we have witnessed rapid development in technology and significant market p...

This book describes for readers various technical outcomes from the EU-project IoSense. The autho...

This book aims to provide a comprehensive reference into the critical subject of failure and degr...

This book describes the latest progress in reliability analysis of microelectronic products. The ...